Waveshare 16LQ50S23030, Test & Burn-in Socket

The Plastronics IC Test & Burn-in Socket for QFN16, MLP16, MLF16 package offers a precise engineering solution for chip testing and reliability evaluation.

Compatible with 16-lead packages, it supports seamless integration into automated test systems. The socket ensures reliable electrical contact and efficient heat dissipation, safeguarding device integrity under rigorous testing conditions.

Ideal for pre-production validation, it accelerates time-to-market by ensuring high performance verification with minimal handling. Suited for both IC testing and burn-in processes, this socket fosters operational efficiency and product accuracy akin to having an orchestra conductor overseeing a flawless symphony.