Experience exceptional reliability with the Enplas IC Test & Burn-in Socket, designed specifically for QFP64, TQFP64, FQFP64, and PQFP64 packages. Its robust construction ensures precise alignment and secure connections, making it ideal for testing and burn-in applications.
Key Benefits:
- High thermal endurance for extended use during rigorous testing scenarios
- Optimized for rapid and efficient heat dissipation, enhancing chip longevity
- Durable contacts to ensure consistent performance and minimal signal distortion
Specifications:
- Compatible with industry standard 64-pin QFP devices
- Engineered for easy insertion and removal, reducing the risk of device damage
- Compact and lightweight design simplifies handling and installation
Examples of Usage:
- Ideal for environments requiring frequent device testing, such as R&D labs
- Essential for ensuring device reliability under high-stress conditions
- Facilitates seamless integration into automated test equipment