Waveshare IC51-1764-1995-6, Test & Burn-in Socket

Experience enhanced testing efficiency with the IC51-1764-1995-6, Yamaichi IC Test & Burn-in Socket. Engineered for QFP176, TQFP176, FQFP176, and PQFP176 packages, this precision socket provides a reliable platform for evaluating advanced semiconductor devices.

Featuring a robust clamshell design, the socket ensures secure and efficient contact, reducing the risk of damage to delicate pins during testing. The use of high-quality materials guarantees durability and longevity, even under extensive thermal cycling.

Ideal for use in a variety of testing and burn-in applications, the IC51-1764-1995-6 facilitates quick insertion and removal of IC packages, significantly improving throughput. Its superior heat dissipation capability ensures consistent performance under rigorous conditions.

With its user-friendly operation, this socket is engineered to streamline your electronic testing processes, much like a conductor guiding an orchestra to achieve a harmonious symphony. Reliable, precise, and efficient, this socket is a key asset in any testing setup.